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[Test] (SelfTest): model the vertex-input-location and layered-blit defects in the fake driver and pin both probes' controls
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@@ -1516,7 +1516,11 @@ namespace MobileGL::MG_Util::BackendLoader {
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// lowers the number, and only on evidence.
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const SelfTest::VertexInputLocationCeilingMeasurement& locationCeiling =
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SelfTest::ExplicitVertexInputLocationCeiling(glesFuncs);
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caps.MaxVertexAttribs = std::min(maxVertexAttribs, locationCeiling.usableLocations);
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// Guarded on `detected` rather than on the number alone: a probe that reached no verdict
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// has measured nothing, and the clamp must be driven by evidence or not applied at all.
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caps.MaxVertexAttribs = locationCeiling.detected
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? std::min(maxVertexAttribs, locationCeiling.usableLocations)
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: maxVertexAttribs;
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if (locationCeiling.detected) {
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MGLOG_I(" GL_MAX_VERTEX_ATTRIBS reduced from the driver's %d to %d: "
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"layout(location = N) on a vertex input is refused from N = %d upward",
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